Application of 3D tool microscope for surface topography analysis of micro- and nanomaterials
In the semiconductor manufacturing process, 3D tool microscope can be used to detect tiny defects and contamination particles on the chip surface. By accurately measuring and analyzing its surface ......
Zoom lenses for industrial manufacturing quality control
Zoom lens in the industrial manufacturing field of product quality inspection link, show the micro world of electronic product manufacturing and large-scale machinery manufacturing macro field....
FA lenses for visual positioning of cell phone panels
FA lenses have become a key optical device in the automation and precision process of cell phone production due to their excellent optical characteristics and ability to adapt to the development of......
Mold Profile Scanning Solution
In the mold manufacturing industry, the mold contour needs to be measured accurately to ensure the quality of the mold, which can enhance the precision of the product....
In-Line Dimensional Gauge for Electronic Parts Production
In-line size measuring instrument plays an important role in electronic parts hole detection, easy to operate, just put the product in the measurement area to get the hole size, can real-time displ......
360° external lens inspection of seals in cylindrical grooves
Through the advanced folding reflection system, the image of the outer wall of the DUT can be skillfully captured and re-imaged at the chip, and the final image is perfectly presented in the shape ......
Application of dual telecentric lenses in inductive height difference detection
The double telecentric lens has unique advantages and value in inductive height difference detection. It eliminates perspective errors and improves the accuracy and reliability of inspection results....
Application of laser focusing microscopy system for defect detection in silicon carbide
With the advantages of high-speed focusing, high accuracy and multi-objective lens switching, the laser focusing microscope system is accurately and efficiently applied in the defect detection of s......
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