Simultaneous Measurement of Multiple Specifications-Online Image Measuring Instrument

In-line image measuring instrument multi-specification simultaneous measurement function solves the challenges faced by traditional measuring equipment in measuring products with multiple specifica......

2025/02/17

author:POMEAS

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Visual inspection solution for cell phone exterior and bezel defects

POMEAS cell phone exterior and bezel defects visual inspection solution can realize high-speed online inspection, significantly improve production efficiency and reduce labor costs....

2025/02/13

author:POMEAS

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Telecentric Lens Detection of Folding Screen Angle Solution

The unique optical characteristics of the telecentric lens, combined with the supporting equipment, realizes high-precision and rapid detection of the opening and closing angle of the folding scree......

2025/02/12

author:POMEAS

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Circuit Board Inspection Solution for Line Scan Lens Applications

Line scanning lens vision solutions can improve circuit board inspection efficiency, reduce the leakage rate, and ensure the quality of circuit boards....

2025/02/12

author:POMEAS

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What lenses are needed to detect scratches on the surface of a chip?

During the production and processing of chips, it is often difficult to avoid the appearance of small defects such as surface scratches, which not only affect the aesthetics of the chip, but also p......

2025/02/11

author:POMEAS

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Image Gauge Application Computer Fan Blade

In the production of computer fan blades, the image measuring instrument accurately measures various key parameters of the fan blades with the advantages of high speed, accuracy and stability....

2025/02/11

author:POMEAS

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Fan Housing for Image Gauge Applications

The image measuring instrument can quickly complete the measurement of several specified parameters of the fan housing, without the need for complex manual adjustment, multiple readings and other o......

2025/02/10

author:POMEAS

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Application of 3D tool microscope for surface topography analysis of micro- and nanomaterials

In the semiconductor manufacturing process, 3D tool microscope can be used to detect tiny defects and contamination particles on the chip surface. By accurately measuring and analyzing its surface ......

2025/02/10

author:POMEAS

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