Autofocus microscope circuit testing
Comprehensive and detailed testing of the circuitry of a POMEAS autofocus microscope is an important safeguard to ensure its excellent performance and stability....
Telecentric Lenses for Semiconductor Measurement
With its unique optical performance and characteristics, telecentric lenses are commonly used in chip pin pitch measurement, chip surface defect detection, package testing and other inspection prog......
Laser autofocus microscope system should be blade tested
Traditional blade inspection methods mostly rely on manual visual inspection or the use of contact measuring tools, which are not only inefficient, but also susceptible to the influence of human fa......
Laser autofocus microscopy for life sciences applications - Cell Observation
The POMEAS laser autofocus microscope not only improves the accuracy and efficiency of observations, but also ensures the integrity and safety of samples....
Spectral Confocal Sensor Applied to New Energy Material Thickness Measurement
The combination of the POMEAS Spectral Confocal Sensor PMS-SFS-D8022 with the controller PMS-SFS-C8001 has demonstrated excellent performance in the new energy industry, especially in the measureme......
Spectral Confocal Sensors for Photovoltaic Panel Quality Inspection
The Spectral Confocal Sensor PMS-SFS-D8020 ensures that the quality and performance of photovoltaic panels meets design requirements by integrating advanced optical technology and sophisticated sig......
Spectral Alignment Vision Measurement Solution for Wafer Inspection
POMEAS Spectral Alignment Vision Measurement solution improves the accuracy and efficiency of wafer inspection, reduces production costs, and meets the semiconductor industry's stringent requiremen......
Gear Measurement by Flash Meter
With its innovative technology and efficient performance, the POMEAS Flash Meter offers a new solution for gear measurement....
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