Product News

Differences between flash and 3D profilers

Flash and 3D profilometers are similar in terms of measurement purpose, measurement method and measurement accuracy, but there are significant differences in terms of measurement dimensions, applicati...

2024/09/09

author:POMEAS

Flash Meter Selection Tips

Because there are so many different types of flash meters with different capabilities, choosing the right product is critical to ensuring measurement accuracy and efficiency. Below is a flash meter se...

2024/09/09

author:POMEAS

Advantages of 3D Profilers

3D Profiler is an advanced non-contact measuring device that utilizes advanced technologies such as optics or lasers to quickly capture and reconstruct the three-dimensional form of an object's surfac...

2024/09/09

author:POMEAS

Principles and Advantages of Flash Meter

The flash meter eliminates the need to rely on a scale displacement sensor as an accuracy scale, and also eliminates the need for large focal length lenses for magnification....

2024/09/09

author:POMEAS

Industrial telecentric zoom lens: principle, parameters, fields of application

In modern industrial production and inspection, high-quality imaging systems such as industrial telecentric zoom lenses are essential to ensure product quality, improve productivity and enable precise...

2024/09/06

author:POMEAS

Features of 360° industrial inspection lenses

With its omni-directional inspection capability, high efficiency and high accuracy, 360° industrial inspection lens plays an increasingly important role in machine vision system, improves product qual...

2024/09/06

author:POMEAS

From Cells to Nanoscale: The Scope of Laser Autofocus Microscopy Applications

With its high accuracy, high speed, stability and wide range of applications, the POMEAS laser autofocus microscope system has demonstrated excellent performance and great application potential in the...

2024/09/04

author:POMEAS

Laser autofocus microscopy in the semiconductor industry case study: Wafer focusing

Defect detection and microstructure analysis on the wafer surface is a key step to ensure the quality of the chip, and traditional inspection means often have problems such as lack of precision, low e...

2024/09/04

author:POMEAS

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