Multi-lens switching for flexible adaptation to diverse needs

The Focus X supports multi-objective switching, a feature that allows for flexible selection of objectives based on different measurement tasks and sample characteristics. In the microscopic world, sample sizes and levels of detail vary greatly.

When measuring tiny electronic components, high-magnification objectives can clearly reveal their fine structures; conversely, low-magnification objectives are more suitable for measuring the overall morphology of large mechanical parts.

The Focus X laser autofocus microscopy system eliminates the need for cumbersome lens changes. With simple operations, users can quickly switch objectives, significantly saving time and costs while markedly improving measurement efficiency.

Seven modules work in tandem to deliver powerful measurement capabilities

Focus X consists of seven core modules. The laser emission module acts as a precise “light source emitter,” emitting a stable, high-precision laser beam to provide accurate optical signals for measurement. The laser reception module functions as a sensitive “signal detector,” precisely detecting changes resulting from the interaction between the laser and the sample surface to obtain information on the sample’s surface elevation. The autofocus module serves as the system’s “intelligent core.” Utilizing advanced algorithms and high-speed processors, it analyzes data in real time and rapidly calculates the optimal focus position, automatically adjusting the objective lens’s focal length. Whether the sample is stationary or moving in real time, it can quickly achieve precise focus.

The motion control module is responsible for controlling the moving components of the microscopic system. It features high-precision positioning and stable motion performance, enabling precise control of the sample’s position and angle according to preset programs, and also includes safety protection functions. The image acquisition module acts as a “high-definition photographer,” capturing sharp, in-focus sample images at high speed and with high quality. The data processing module serves as a “data analysis expert,” performing in-depth analysis of image data to extract morphological features and accurately calculate measurement parameters. The software control module acts as the “communication bridge” between the user and the system, providing a user-friendly and intuitive interface that allows users to set parameters, select modes, and achieve comprehensive control over the system.

Compatible with standard objectives, suitable for a wide range of measurement scenarios

The Focus X is compatible with standard 2X–100X objectives, offering excellent versatility and compatibility with most microscope objectives on the market. Users need not worry about objective replacement or compatibility issues and can freely select objectives with different magnifications according to their needs.

At the same time, the system supports calibration and compensation for objectives of different brands and models, ensuring accurate measurement results regardless of the objective used. Whether measuring workpieces with complex geometries such as deep holes, inclined surfaces, or curved surfaces, the system utilizes features like layered focusing to penetrate deep into the interior or measure surfaces at different heights layer by layer, accurately capturing parameters such as height, step height, thickness, flatness, and contour. This provides robust support for industrial manufacturing, quality control, and scientific research.