3D White Light Interference Profiler
The POMEAS 3D White Light Interference Profiler is capable of “in-plane” measurements with better than nanometer resolution and non-contact measurement of sample surface topography without damaging th
Optics General Catalog
Products
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POMEAS 3D white light interferometric profilers are capable of “in-plane” measurements with better than nanometer resolution, non-contact measurement of sample surface topography without damaging the product itself. WLI-1000 is widely used in optics, semiconductors, materials, precision machinery and other fields for surface texture and microstructure analysis.
Product Features
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1. Roughness measurements characterizing microscopic morphology;
2, step height, angle and other contour size measurement;
3, automatic focus, automatic stripe finding, automatic brightness adjustment and other automated auxiliary functions;
4, leveling, image retouching, denoising and filtering, regional extraction and other data processing functions;
5, comparative analysis and multi-document analysis and other auxiliary analysis functions.
Areas of application
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Product Parameters
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Tel:+ 86-0769-2266 0867
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