For small and complex objects such as the R232 connector, POMEAS microscopes have an autofocus function for fast and accurate focus adjustment....
Faced with the high standard of mobile phone volume key measurement, POMEAS in-line projection image measuring instrument adopts advanced image processing technology and high precision optical system,...
Chip appearance defect detection is determined by a combination of the high resolution of industrial lenses, the flexibility of zoom lenses, and the measurement accuracy of telecentric lenses....
The complex shape of arched metal parts containing curved surfaces and curvilinear elements, POMEAS 3D Profile Measuring Instruments, provide a solution for the inspection of arched metal parts....
The Focus laser autofocus microscope significantly improves the accuracy and efficiency of semiconductor wafer inspection with its height-independent, real-time and automatic focusing....
Adoption of FA lenses, industrial cameras and other inspection solutions improves inspection efficiency and quality by virtue of its high-precision inspection capability, efficient automated processes...
Laser autofocus microscopy systems have significant advantages in LCD line inspection, and can greatly improve inspection efficiency and accuracy, while protecting the integrity of the LCD and extendi...
The POMEAS in-line image projection measurement solution for Type-C cable charging head width measurement offers the advantages of high accuracy, non-contact, in-line measurement, and data logging and...
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