Industry pain point: the high reflective surface of the “invisible defects” of the difficulties

In the consumer electronics industry, metal cell phone shell for high-end texture, durability is highly favored, but its mirror polished surface is very easy to reflect ambient light, the traditional optical inspection equipment is often due to reflective interference resulting in overexposure of the image, the loss of details, micron-level scratches, pits, and other defects are difficult to accurately capture. According to industry research, a head of cell phone manufacturers have been due to the shell defects leakage led to batch of customer complaints, a single loss of more than ten million yuan. How to achieve stable imaging of highly reflective surfaces and rapid screening of nanoscale defects has become a core challenge for the industry to improve quality and efficiency.

For the inspection of metal, glass, coated parts and other highly reflective materials, POMEAS launched the Focus X laser focusing microscope system, with adaptive laser focusing technology and multimodal imaging algorithms as the core, breaking through the traditional optical limitations and providing a one-stop solution for difficult quality inspection scenarios.
 

1. Anti-interference laser focusing: 532nm short wavelength laser source, penetrating, can inhibit environmental stray light interference. Intelligent adjustment of laser incidence angle and intensity to avoid mirror reflection overexposure and ensure imaging clarity.

2. Nano-scale precision capture: resolution of 0.1μm, which can recognize defects such as micro-scratches and particle adhesion that are not visible to the naked eye. Supports 3D morphology reconstruction to accurately quantify the depth, width and distribution characteristics of scratches.

3. Millisecond dynamic response: focusing speed**<10ms**, adapted to high-speed production lines (up to 60fps), realizing 100% online full inspection. Automatically compensates for environmental variables such as vibration and temperature fluctuations to ensure inspection stability.