Testing Background

With the continuous development of science and technology, silicon carbide (SiC) materials have been widely used in various fields such as fabrication, packaging and testing, devices and modules due to their excellent physical and chemical properties. However, certain characteristics of silicon carbide, such as high hardness and brittleness, pose challenges to its processing and subsequent product quality control. These characteristics may lead to defects, such as cracks and inclusions, in silicon carbide products during the manufacturing process, and these defects can directly affect the performance and reliability of the products. Therefore, the detection of defects in silicon carbide products is particularly important.

Inspection solution: In order to effectively deal with the problem of detecting defects in silicon carbide products, the laser focusing microscope system has come into being.

High Speed Focusing Capability: Laser focusing microscopes have extremely fast focusing speeds, typically less than 0.4 seconds. This means that the system is able to focus on silicon carbide products in a fraction of the time, which greatly improves inspection efficiency. This is particularly important for mass-produced silicon carbide products, which can significantly shorten inspection cycles and reduce production costs.

High-precision focusing: In addition to its speed, the laser focusing microscope also has the ability to focus with high precision. It is able to accurately position the focus on minute defects in the silicon carbide product, such as cracks, inclusions, etc. This high-precision focusing ability ensures the accuracy and reliability of the inspection and avoids misjudgment or omission due to inaccurate focusing.

Multi-objective switching function: For different sizes and types of silicon carbide products, the laser focusing microscope system provides a multi-objective switching function. This means that the system can select the appropriate objective lens for observation and inspection according to actual needs. This flexibility allows the system to cope with a variety of complex inspection scenarios, improving applicability and versatility.

Accurate Detection of Silicon Carbide Problems: Thanks to the technical advantages mentioned above, the laser focus microscope system is able to accurately see problems with silicon carbide products. Whether it is tiny cracks, inclusions or other types of defects, the system is able to identify and localize them accurately. This provides strong technical support for quality control of silicon carbide products.