Detection needs:

In the semiconductor industry, the precision requirements for semiconductor chips are getting higher and higher, and it is necessary to detect product surface defects, size and shape, and product quality is directly related to the reliability and performance of electronic devices.

Common defects include scratches, chipping, foreign objects, etc. These defects may affect the electrical characteristics of the chip or even lead to product failure. Therefore, timely detection and correction of these defects is essential to improve product yield.

Lens technology for observing subtle defects:

In order to observe subtle defects, HD lenses are required. High-definition lenses provide clear images, enabling inspectors to accurately identify minute defects. In addition, HD lenses offer high contrast and a wide spectral response, which helps in inspection under different lighting conditions.

Advantages of the POMEAS FA lens:

1. High resolution: The POMEAS FA lens provides high resolution images, ensuring that even the smallest defects can be detected.

2. High Contrast: Enhanced image contrast makes defects more clearly distinguishable from their surroundings.

3. Wide Spectral Response: Adapts to a wide range of light sources, ensuring that image quality is maintained in different environments.

4. Durability: Designed for use in industrial environments with high durability and stability.

POMEAS FA lenses can effectively improve the accuracy and efficiency of defect detection in actual semiconductor inspection. Through a combination of solution hardware and advanced image processing software, POMEAS FA lenses are able to automate defect recognition, size and shape.