White light interferometric 3D profiler for precise capture of metal surface topography

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2024/09/10

author:adminBOSS

In modern industry and scientific research, it is crucial to assess the performance and quality of metallic materials, and their surface topography is one of the key considerations. With the advent of the POMEAS White Light Interference 3D Profiler, a powerful and reliable solution is provided for the accurate inspection of metal surface topography.

 

 

With its advanced optical technology and high precision measurement capability, the POMEAS White Light Interferometric 3D Profiler is able to scan the condition of metal surfaces in meticulous detail. Whether it's the subtle textures created during the manufacturing process of metal parts, or surface changes due to wear and corrosion, etc., they can be clearly captured and rendered.

 

 

The POMEAS White Light Interferometric 3D Profiler excels in measuring thickness variations on metal surfaces. The non-contact measurement method can accurately obtain thickness variations in different areas of the metal surface, providing accurate data for quality control and process optimization during production.

 

 

When it comes to scanning metal morphology, the POMEAS White Light Interferometric 3D Contouring System is unrivaled. It quickly generates high-resolution 3D images of metal surfaces, allowing the microstructure and macro features of the metal surface to be visualized at a glance. Complex surfaces as well as tiny bumps and depressions can be visualized with accurate data and realistic images.

 

 

These powerful features make the POMEAS White Light Interferometric 3D Contouring System widely used in automotive manufacturing, aerospace, electronics industry and many other fields. It not only helps to improve the quality and reliability of products, but also provides strong technical support for R&D and innovation.

 

 

A new chapter in the industrial production and scientific research of the POMEAS white light interferometric 3D profiler.

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