In the semiconductor industry, wafer inspection is a key component to ensure chip quality. POMEAS provides three major solutions for wafer inspection, namely Laser AF Microscope, Spectral AF Microscope and 4K HD Lens Observation Solution.

The laser autofocus microscope has a high precision focusing capability to quickly and accurately focus on the wafer to ensure a clear image during inspection. The system utilizes laser technology to achieve autofocus, greatly improving inspection efficiency and accuracy.

The Spectral AF Microscope analyzes spectral information to achieve automatic focusing. It can accurately inspect wafers made of different materials and performs well especially in complex inspection environments. The system provides a wealth of spectral data to provide more comprehensive information for wafer inspection.

The 4K HD lens observation solution provides high-resolution images for wafer inspection.The 4K HD lens captures minute details on the wafer, allowing inspectors to see the surface conditions and defects of the wafer more clearly. This solution is suitable for inspection scenarios that require high image quality.

Each of POMEAS' three main wafer inspection solutions has its own advantages and can be selected according to different inspection needs. Whether you are looking for high-precision focusing, rich spectral information, or high-resolution images, POMEAS provides reliable solutions for wafer inspection.