With the booming development of solar photovoltaic industry, photovoltaic silicon wafers, as the core material of solar cells, its quality and stability are getting more and more attention, and it is especially important to carry out appearance inspection on photovoltaic silicon wafers.

There are a wide variety of appearance defects in PV wafers, the common ones are cracks, scratches, bubbles, dust, and so on. These defects not only affect the aesthetics of silicon wafers, but also, more seriously, lead to a decrease in the power of the cell, or even failure. Therefore, timely detection and elimination of these defects to ensure the quality and stability of silicon wafers is of great significance to improve the power generation efficiency and extend the service life of PV cells.

The vision inspection solution of industrial lens supporting industrial camera is widely used in silicon wafer appearance inspection, which can quickly and accurately detect surface defects. However, there are many types of industrial lenses on the market, what type of lens to choose to complete the inspection efficiently and accurately?

With the advantages of high speed and high resolution, POMEAS new line scan industrial lenses can be used in vision solutions to obtain high-quality wafer surface images, clearly and quickly identify cosmetic defects, and improve inspection efficiency and accuracy.

Line scan industrial lenses offer the following advantages:

1. High-speed scanning: the line scanning lens can complete the scanning of the entire wafer in a short period of time, which greatly improves the inspection efficiency.

2. High resolution: Line scan lenses typically have a resolution of thousands of pixels, allowing for the capture of minute defects and their precise location and discrimination.

3. High degree of automation: the line scanning lens with image processing software can achieve automated detection, avoiding the subjectivity and errors of manual visual inspection.

4. Adaptable: the line scanning lens can be adapted to different inspection needs, and can be adjusted and optimised according to different types of defects.