Industrial inspection microscopes are widely used inspection equipment in the field of modern industrial inspection. They are mainly used for observing the microstructure of small objects, quality assessment, and defect detection. According to different application scenarios and specific needs, industrial inspection microscopes can be divided into many different types of equipment. This article will introduce some of the common industrial inspection microscopes.

The first is the video microscope, which does not require eyepieces and can be observed directly through the monitor. It is not easy to cause fatigue when observing. The video microscope adopts an integrated body, which has the advantages of easy movement, simple operation, and wide field of view. It is widely used in electronic devices, Plastic parts, integrated circuits, chemical materials, glass ceramics and other fields.

The second is the tool microscope, which can be used to measure the size, angle and other parameters of the workpiece within the range. It is a multi-functional device widely used in circuit board inspection, hardware inspection, measurement testing and other applications.

In addition, there is a differential interference DIC microscope, which is equipped with a professional plan achromatic long working distance objective lens, uses DIC technology, and cooperates with a specifically designed coaxial light source to achieve uniform interference colors throughout the field of view, clear images, and high contrast. The small height difference on the surface of the object to be measured produces an obvious relief effect, which can clearly identify cracks, bulges, particles and holes.

As one of the important equipment in the field of modern industrial inspection, industrial inspection microscopes have a variety of types and application scenarios. During the actual purchase and use process, it is necessary to select the appropriate equipment type and magnification based on specific needs and sample characteristics to achieve high-level detection and observation effects.